MATERIALS
ANALYSIS/CHARACTERIZATION
AES
Auger Electron Spectroscopy
AFM/SPM
Atomic Force Microscopy
Scanning Probe Microscopy
XPS/ESCA
X-ray Photoelectron Spectroscopy/
Electron Spectroscopy for Chemical Analysis
FTIR
Fourtier Transform Infrared Spectroscopy
GC/MS
Gas Chromotography/Mass Spectrometry
FE SEM
Field Emission Scanning Electron
SEM/EDS
Scanning Electron Microscopy/Energy Dispersive
X-ray Spectroscopy
FIB
Focused Ion Beam
TOF-SIMS
Time-Of-Flight Secondary Ion Mass Spectrometry
Raman
Raman Spectroscopy
XRF
X-ray Fluorescence
TXRF
Total Reflection X-ray Fluorescence
Accelerator
Techniques
RBS
Rutherford Backscattering
Spectrometry
PIXE
Particle Induced X-ray Emission
NRA
Nuclear Reaction Analysis
HFS
Hydrogen Forward Scattering Spectrometry
SIMS
Secondary Ion Mass Spectrometry
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